Cos453_DeviceFailureStatus_s Struct Reference

Detailed Description

This structure mirrors the Device failure status object (6012_h) as specified in CiA 453 section 9.5.6. Every field is a 32-bit word whose bit layout follows Figure 14 of the specification.

The condition sub-parameter (01_h) accumulates the failure states of the input and all outputs as well as device-specific signals. The logic, fault state, and fault indication sub-parameters configure and reflect the failure processing chain as defined in section 7.3.

Collaboration diagram for Cos453_DeviceFailureStatus_s:

Data Fields
uint32_t	ulCondition
uint32_t	ulLogic
uint32_t	ulEvent
uint32_t	ulFaultState
uint32_t	ulFaultIndication

Field Documentation

ulCondition

uint32_t Cos453_DeviceFailureStatus_s::ulCondition

01h: Condition signals (ro)

ulEvent

uint32_t Cos453_DeviceFailureStatus_s::ulEvent

03h: Event signals (ro)

ulFaultIndication

uint32_t Cos453_DeviceFailureStatus_s::ulFaultIndication

05h: Fault indication signals (ro)

ulFaultState

uint32_t Cos453_DeviceFailureStatus_s::ulFaultState

04h: Fault state fields (rw)

ulLogic

uint32_t Cos453_DeviceFailureStatus_s::ulLogic

02h: Logic fields (rw)